質(zhì)量管理體系
東微半導體已通過(guò) ISO9001：2015質(zhì)量體系認證。
考慮到產(chǎn)品安全性，確保提供給客戶(hù)的產(chǎn)品能夠符合國際、國內法律法規及客戶(hù)對有害物質(zhì)管理的要求，
東微半導體制定有害物質(zhì)管理辦法，確保提供的產(chǎn)品符合無(wú)鹵， 歐盟RoHS（EURoHS）、REACH高度關(guān)注物質(zhì)有害物質(zhì)要求。
東微半導體一直致力于向客戶(hù)提供高性能，高可靠性的產(chǎn)品，產(chǎn)品滿(mǎn)足以下可靠性要求。
| Automotive | Pre-Con | MSL | / | Note1 | 0/1 | JESD22-A113 |
| HTGB | VGS=VGS max, Tj=Tj max | 1000 hrs | 3×77 | 0/3 | JESD22-A108 | |
| HTRB | VDS=100% Reverse Bias, Tj=Tj max | 1000 hrs | 3×77 | 0/3 | JESD22-A108 | |
| HAST | 130°C/85%RH/80% Reverse Bias up to 42V | 96 hrs | 3×77 | 0/3 | JESD22-A110 | |
| H3TRB | 85°C/85%RH, 80% Reverse Bias up to 100V | 1000 hrs | 3×77 | 0/3 | JESD22-A101 | |
| UHAST | 130°C/85%RH | 96 hrs | 3×77 | 0/3 | JESD22-A118 | |
| AC | 121°C/100%RH/29.7 PSIa | 96 hrs | 3×77 | 0/3 | JESD22-A102 | |
| IOL | Delta Tj>=100C | 1000 hrs | 3×77 | 0/3 | JESD22-A108 / MIL-STD-750 Method 1037 | |
| TS | ‐55°C to 150°C | 1000 cycles | 3×77 | 0/3 | JESD22-A106B | |
| PV | Test samples over device temperature range (Tri‐temp) | / | 1×25 | 0/1 | / | |
| SD2 | Temperature and time: SnPb：235±5℃, 5±0.5s; Pb-free：245±5℃, 5±0.5s; 245±5℃,5±0.5sec，solder area>95% | / | 1×22 | 0/1 | JEDECJ-STD-002 | |
| RSH2 | 260±5℃, 10±1s/3 times | / | 1×45 | 0/1 | JESD22-A-111 | |
| Industrial | Pre-Con | MSL | / | Note1 | 0/1 | JESD22-A113 |
| HTGB | VGS=VGS max, Tj=Tj max | 1000 hrs | 3×77 | 0/3 | JESD22-A108 | |
| HTRB | VDS= 80% Reverse Bias, Tj=Tj max | 1000 hrs | 3×77 | 0/3 | JESD22-A108 | |
| HAST | 130°C/85%RH,VDS=80% Reverse Bias up to 42V | 96hrs | 3×77 | 0/3 | JESD22-A110 | |
| H3TRB | 85°C/85%RH, 80% Reverse Bias up to 100V | 1000 hrs | 3×77 | 0/3 | JESD22-A101 | |
| UHAST | 130°C/85%RH | 96 hrs | 3×77 | 0/3 | JESD22-A118 | |
| AC | 121°C/100%RH/29.7 PSIa | 96 hrs | 3×77 | 0/3 | JESD22-A102 | |
| IOL | Tj=25C, Delta Tj>=100C | 1000 hrs | 3×77 | 0/3 | JESD22-A108 / MIL-STD-750 Method 1037 | |
| TC | ‐55°C to 150°C | 1000 cycles | 3×77 | 0/3 | JESD22-A104E | |
| SD | Temperature and time: SnPb：235±5℃, 5±0.5s; Pb-free：245±5℃, 5±0.5s; 245±5℃,5±0.5sec，solder area>95% | / | 1×22 | 0/1 | JEDECJ-STD-002 | |
| RSH | 260±5℃, 10±1s/3 times | / | 1×45 | 0/1 | JESD22-A-111 | |
| Consumer | Pre-Con | MSL | / | Note1 | 0/1 | JESD22-A113 |
| HTGB | VGS=VGS max, Tj=Tj max | 500 hrs | 3×77 | 0/3 | JESD22-A108 | |
| HTRB | VDS= 80% Reverse Bias, Tj=Tj max | 500 hrs | 3×77 | 0/3 | JESD22-A108 | |
| TC | ‐55°C to 150°C | 500 cycles | 3×77 | 0/3 | JESD22-A104E | |
| SD | Temperature and time: SnPb：235±5℃, 5±0.5s; Pb-free：245±5℃, 5±0.5s; 245±5℃,5±0.5sec，solder area>95% | / | 1×22 | 0/1 | JEDECJ-STD-002 | |
| RSH | 260±5℃, 10±1s/3 times | / | 1×45 | 0/1 | JESD22-A-111 |
? COPYRIGHT 2008 - 2024 蘇州東微半導體股份有限公司 版權所有 蘇ICP備18022065號-1